杨广, 胡君遂, 堵永国, 张家春. 碳膜的制备及其在纳米颗粒观察中的应用[J]. 分析测试技术与仪器, 1998, (1): 26-28.
引用本文: 杨广, 胡君遂, 堵永国, 张家春. 碳膜的制备及其在纳米颗粒观察中的应用[J]. 分析测试技术与仪器, 1998, (1): 26-28.
Yang Guang, Hu Junsui, Du Yongguo, Zhang Jiachun. Preparation of Carbon Film and Its Application in Nanometer Powders Observation[J]. Analysis and Testing Technology and Instruments, 1998, (1): 26-28.
Citation: Yang Guang, Hu Junsui, Du Yongguo, Zhang Jiachun. Preparation of Carbon Film and Its Application in Nanometer Powders Observation[J]. Analysis and Testing Technology and Instruments, 1998, (1): 26-28.

碳膜的制备及其在纳米颗粒观察中的应用

Preparation of Carbon Film and Its Application in Nanometer Powders Observation

  • 摘要: 阐述了透射电镜中碳膜的制备方法,并讨论了影响碳膜质量的因素;用这种碳膜支持纳米颗粒在透射电镜下观察,碳膜在电子束的长时间照射下,不发生变形和起皱,图象清晰,衬度均匀.

     

    Abstract: The preparation method of carbon film in transmission electron microscopy(TEM) was stated. The influence factors on quality of carbon film were discussed. The carbon film was used for supporting nanometer powders. When it was irradiated by electron beam for long time in TEM, the carbon film was not deformation and not wrinkle. The image of microstructure was clear, and the contrast of the image was uniform.

     

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