李剑平. 扫描电子显微镜对样品的要求及样品的制备[J]. 分析测试技术与仪器, 2007, (1): 74-77.
引用本文: 李剑平. 扫描电子显微镜对样品的要求及样品的制备[J]. 分析测试技术与仪器, 2007, (1): 74-77.
LI Jian-ping. Requirements and Preparation of Scanning ElectronMicroscope Sample[J]. Analysis and Testing Technology and Instruments, 2007, (1): 74-77.
Citation: LI Jian-ping. Requirements and Preparation of Scanning ElectronMicroscope Sample[J]. Analysis and Testing Technology and Instruments, 2007, (1): 74-77.

扫描电子显微镜对样品的要求及样品的制备

Requirements and Preparation of Scanning ElectronMicroscope Sample

  • 摘要: 扫描电子显微镜对样品的要求很严,要求样品必须是固体,且做到五无:无毒、无放射性、无污染、无磁、无水分,成分稳定,块状样品大小要适中,粉末样品要进行特殊处理,对不导电和导电性能差的样品要进行镀膜,且要选择适当的镀膜仪,方能达到理想的分析效果.

     

    Abstract: The requirements for SEM samples are very strict,the sample must be a solid and non-toxic, non-radioactive, non-polluting, non-magnetic, non-moisture, the ingredients of the sample must be stable. The size of bulk sample should be moderate and the powder sample should be handled specially. In order to achieve the desired analysis results,the non-conductive sample should be coated with appropriate coating system.

     

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