Abstract: A simple and nondestructive measurement method has been developed to measure the main impurities in graphene powder. The measurement results of X ray fluorescence spectrum (XRF) and several test techniques of inductively coupled plasma-optical emission spectrum (ICP-OES), inductively coupled plasma-mass spectrometry(ICP-MS) and energy dispersive X-ray (EDX) etc. were compared in detail. It is confirmed that the main non-metallic impurities, S, Cl, Si, P, and the metallic impurities, Na, Mg, Ca, Fe, Cu, Ti, W, Cr etc., can be detected accurately and reliably using XRF. So that XRF can realize the rapid, feasible, non-destructive, and low-cost quantitative measurement of the main impurities in graphene powder once certified reference material(CRM) of the chemical composition of graphene is developed.