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方跃平, 徐盈. ARL—3520AES电感耦合等离子体发射光谱仪疑难故障的分析与排除[J]. 分析测试技术与仪器, 1996, (1): 45-49.
引用本文: 方跃平, 徐盈. ARL—3520AES电感耦合等离子体发射光谱仪疑难故障的分析与排除[J]. 分析测试技术与仪器, 1996, (1): 45-49.
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Fang Yueping, Xu Ying. Trouble Shooting and Fixing of Knotty Breakdown of ARL ICP-3520AES[J]. Analysis and Testing Technology and Instruments, 1996, (1): 45-49.
Citation: Fang Yueping, Xu Ying. Trouble Shooting and Fixing of Knotty Breakdown of ARL ICP-3520AES[J]. Analysis and Testing Technology and Instruments, 1996, (1): 45-49.
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ARL—3520AES电感耦合等离子体发射光谱仪疑难故障的分析与排除

Trouble Shooting and Fixing of Knotty Breakdown of ARL ICP-3520AES

    摘要
  • 摘要: 介绍了在瑞士ARL公司生产的ICP-3520AES型电感耦合等离子体原子发射光谱仪上存在的一种疑难故障的分析与排除过程,对同类型仪器的故障分析有借鉴作用。

     

    Abstract: The shooting and fixing of the knotty breakdown of a ARL ICP-3520AES is described.

     

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