王桂英, 陈侦, 步杨, 徐至展, 王之江. 纳米分辨率的三维形貌检测仪[J]. 分析测试技术与仪器, 1998, (4): 193-197.
引用本文: 王桂英, 陈侦, 步杨, 徐至展, 王之江. 纳米分辨率的三维形貌检测仪[J]. 分析测试技术与仪器, 1998, (4): 193-197.
Wang Guiying, Chen Zhen, Bu Yang, Xu Zhizhan, Wang Zhijiang. Tree Dimension Profile Testing with Nanometer Resolution[J]. Analysis and Testing Technology and Instruments, 1998, (4): 193-197.
Citation: Wang Guiying, Chen Zhen, Bu Yang, Xu Zhizhan, Wang Zhijiang. Tree Dimension Profile Testing with Nanometer Resolution[J]. Analysis and Testing Technology and Instruments, 1998, (4): 193-197.

纳米分辨率的三维形貌检测仪

Tree Dimension Profile Testing with Nanometer Resolution

  • 摘要: 从光干涉方式、瞳窗关系和光源带宽等基本关系出发,利用空间不变系统理论解析了相移显微干涉检测系统中衍射效应的影响.为了减小横向分辨率对纵向分辨率的影响,利用相关信息提取或数字滤波的方法,获得了纳米分辨率的三维形貌.

     

    Abstract: The diffraction effect on transversal and vertical resolution was analyzed by a simulation computation for spatial invariant system. Interference way, relation of resolution with clear apertures of the system, and light source bandwidth were considered. To reduce the effect of transversal resolution on vertical resolution, a correlation information extraction, in other words, a numeral filtering method has been suggested and the surface profile of three dimension with nanomerter has also been obtained.

     

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