薛光荣. 用N2O-C2H2火焰原子吸收光谱法测定膨胀合金中硅[J]. 分析测试技术与仪器, 2006, (4): 235-238.
引用本文: 薛光荣. 用N2O-C2H2火焰原子吸收光谱法测定膨胀合金中硅[J]. 分析测试技术与仪器, 2006, (4): 235-238.
XUE Guang-rong. Measurement of Silicon in the Alloy Expands by N2O-C2H2 Flame Atomic Absorption Spectrometer[J]. Analysis and Testing Technology and Instruments, 2006, (4): 235-238.
Citation: XUE Guang-rong. Measurement of Silicon in the Alloy Expands by N2O-C2H2 Flame Atomic Absorption Spectrometer[J]. Analysis and Testing Technology and Instruments, 2006, (4): 235-238.

用N2O-C2H2火焰原子吸收光谱法测定膨胀合金中硅

Measurement of Silicon in the Alloy Expands by N2O-C2H2 Flame Atomic Absorption Spectrometer

  • 摘要: 采用N2O-C2H2火焰原子吸收光谱法测定膨胀合金中硅.建立了硅的最佳测定条件,并在样品测定中对干扰因素进行了综合考虑.实验表明:该方法具有灵敏度高、选择性好,操作简便、容易掌握、分析周期短等优点.其相对标准偏差均小于1.0%(n=6).标准加入回收率均为97.0%~99.0%(n=6)范围内.可以作为检测膨胀合金中硅含量的一种手段.

     

    Abstract: The application of N2O-C2H2 flame Atomic absorption spectrometer to measure of silicon in the alloy expands is studied.This paper introduces the optimum measuring conditions for silicon and potency in which a fine liner range presents.And makes a synthetic consideration to interference factors.The method has the advantages of high sensitivity,less interference and good in selectivity and reappearance.The relative standard deviations are all less than 1.0%(n=6)in six sample measures,and the standard adding recovery is in the range of 97.0%~99.0%(n=6),the practice shows that the method is fully suitable to measure the silicon in the alloy expands.

     

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