任艳军, 秦素平. 扫描电镜非最佳条件操作考察[J]. 分析测试技术与仪器, 2008, 14(1): 59-61.
引用本文: 任艳军, 秦素平. 扫描电镜非最佳条件操作考察[J]. 分析测试技术与仪器, 2008, 14(1): 59-61.
REN Yan-jun, QIN Su-ping. Study on Scanning Electron Microscope Working atNonoptimum Observation Conditions[J]. Analysis and Testing Technology and Instruments, 2008, 14(1): 59-61.
Citation: REN Yan-jun, QIN Su-ping. Study on Scanning Electron Microscope Working atNonoptimum Observation Conditions[J]. Analysis and Testing Technology and Instruments, 2008, 14(1): 59-61.

扫描电镜非最佳条件操作考察

Study on Scanning Electron Microscope Working atNonoptimum Observation Conditions

  • 摘要: 扫描电镜在非最佳的条件下工作仍能获得有用的信息,尤其是样品导电性差,又不便喷金,还要尽可能将样品原来的面貌保存下来取得高质量照片的时候,其效果显著.

     

    Abstract: Scanning electron microscope working at nonoptimum observation conditions can also provide useful information.This effect is especially notable when the samples are nonconductive and not proper to evaporate Au or C. Under the proposed condition the microstructures of the specimen surface were reserved . Satisfactory photos were obtainable.

     

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