Development of Simulated Spatial In-Situ Analysis and Characterization System for Infrared Spectrometer

To develop the available fourier infrared spectrometer, the spatial simulation test system was connected with the spectrometer through flange and external in-situ vacuum cell, thus the sample pushing mechanism was established. A double gate valve was used between the analytical unit and the main vacuum chamber, so the two-way sealing can be realized by the combination, and the surface of material can be analyzed in-situ independently. The friction samples can be characterized by the precise sample transmission and positioning device moving to the analysis unit, the in-situ analytical function of the friction surface under simulated spatial environment, the accurately correlation of the space tribological behavior of lubricating material with its surface and chemical state can be realized, and the environmental pollution to friction surface can be avoided. A reliable experimental basis for the design of new spatial lubricating material is provided.