Fang Yan, Li Kewei, Fang Chunhui. Study on Solution Structure with X-ray Diffractometer New Simple Isothermal Technology[J]. Analysis and Testing Technology and Instruments, 1995, (3): 42-44.
Citation:
Fang Yan, Li Kewei, Fang Chunhui. Study on Solution Structure with X-ray Diffractometer New Simple Isothermal Technology[J]. Analysis and Testing Technology and Instruments, 1995, (3): 42-44.
Fang Yan, Li Kewei, Fang Chunhui. Study on Solution Structure with X-ray Diffractometer New Simple Isothermal Technology[J]. Analysis and Testing Technology and Instruments, 1995, (3): 42-44.
Citation:
Fang Yan, Li Kewei, Fang Chunhui. Study on Solution Structure with X-ray Diffractometer New Simple Isothermal Technology[J]. Analysis and Testing Technology and Instruments, 1995, (3): 42-44.
Study on Solution Structure with X-ray Diffractometer New Simple Isothermal Technology
Based on the characteristic change of resistivity with temperature a new simple isothermal apparatus has been designed for the measurement of the liquid structure with 2θ-θtype x-ray diffractometer. This apparatus has the advantages of high practicability,low price and easiness in operation.
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