Xie Yunqing, Lian Yeliang. Determination of Halogen Ratioin Emulsion for Lithographic Film[J]. Analysis and Testing Technology and Instruments, 1996, (1): 37-39.
Citation:
Xie Yunqing, Lian Yeliang. Determination of Halogen Ratioin Emulsion for Lithographic Film[J]. Analysis and Testing Technology and Instruments, 1996, (1): 37-39.
Xie Yunqing, Lian Yeliang. Determination of Halogen Ratioin Emulsion for Lithographic Film[J]. Analysis and Testing Technology and Instruments, 1996, (1): 37-39.
Citation:
Xie Yunqing, Lian Yeliang. Determination of Halogen Ratioin Emulsion for Lithographic Film[J]. Analysis and Testing Technology and Instruments, 1996, (1): 37-39.
Determination of Halogen Ratioin Emulsion for Lithographic Film
X-ray fluorescence spectrometry is employed to determine directly the halogen ratio in high quality lithographic film without preliminary sample preparation.The principle and experimental techniques of the method are given in detail.The method is characterized by its simplicity,rapidity and accuracy.
E-alert
DownLoad: