LI Changhou. Brief Discussion About the Reliability for UV VISS[J]. Analysis and Testing Technology and Instruments, 1999, (4): 246-248.
Citation: LI Changhou. Brief Discussion About the Reliability for UV VISS[J]. Analysis and Testing Technology and Instruments, 1999, (4): 246-248.

Brief Discussion About the Reliability for UV VISS

  • The main factors affecting the reliability of UV VIS Spectrophotometer(UV-VISS) are briefly discussed in the view of stray light, noise, chemistry and electricity. At the same time, the approaches for ensuriny of UV-VISS are discussed, ranging from the research development of the devices to detective methodes.
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