WANG Da-hai, GAO Yuan-peng, LUO Huan. Development of Simple Temperature Heating Station of D8 X-ray Diffractometer[J]. Analysis and Testing Technology and Instruments, 2013, 19(2): 65-70.
Citation: WANG Da-hai, GAO Yuan-peng, LUO Huan. Development of Simple Temperature Heating Station of D8 X-ray Diffractometer[J]. Analysis and Testing Technology and Instruments, 2013, 19(2): 65-70.

Development of Simple Temperature Heating Station of D8 X-ray Diffractometer

  • A simples, variable temperature heating unit has been successfully developed,which be quickly and easily installed on the X-ray diffractometer,without any replacement of D8 X-ray diffractometer attachment cases. In situ variable temperature X-ray diffraction test,meeting the demand from room temperature to 600℃ in-situ temperature X-ray diffraction test can be carried out, shortening the time of replacement of the attachment from 2~3 days to 30 min. The test efficiency is improve. A fund of nearly 20 million has been saved from the purchase of a similar variable temperature heating device.
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