FENG Shan-e, GAO Wei-jian, CHEN Mu-zi. Application of Scanning Electron Microscope in Analysis of Polysilicon Cell Welding Zone[J]. Analysis and Testing Technology and Instruments, 2013, 19(2): 114-117.
Citation:
FENG Shan-e, GAO Wei-jian, CHEN Mu-zi. Application of Scanning Electron Microscope in Analysis of Polysilicon Cell Welding Zone[J]. Analysis and Testing Technology and Instruments, 2013, 19(2): 114-117.
FENG Shan-e, GAO Wei-jian, CHEN Mu-zi. Application of Scanning Electron Microscope in Analysis of Polysilicon Cell Welding Zone[J]. Analysis and Testing Technology and Instruments, 2013, 19(2): 114-117.
Citation:
FENG Shan-e, GAO Wei-jian, CHEN Mu-zi. Application of Scanning Electron Microscope in Analysis of Polysilicon Cell Welding Zone[J]. Analysis and Testing Technology and Instruments, 2013, 19(2): 114-117.
Application of Scanning Electron Microscope in Analysis of Polysilicon Cell Welding Zone
The feature and composition distribution of the polysilicon cell welding zone, which is metallographically embedded, and silicon wafer is characterized by scanning electron microscopy to understand the welding condition, thus technical support is provided for the optimization of the process.
E-alert
DownLoad: